Scanning Electron Microscope – High-Resolution Surface Imaging
A Scanning Electron Microscope (SEM) is an advanced imaging tool that uses a focused beam of electrons to produce detailed, high-resolution images of a sample’s surface. Unlike optical microscopes, SEMs reveal fine surface structures at magnifications up to hundreds of thousands of times, making them essential in materials science, nanotechnology, biology, and forensics. SEMs provide exceptional depth of field and can analyze surface composition using Energy Dispersive X-ray Spectroscopy (EDS). From studying micro-organisms to examining metal fractures, a scanning electron microscope delivers unparalleled precision, enabling researchers to explore the microscopic world in extraordinary detail.
5 visualizações